A true random number generator (TRNG) is proposed and evaluated by field-programmable gate arrays (FPGA)\nimplementation that generates random numbers by exclusive-ORing (XORing) the outputs of many SR latches (Hata\nand Ichikawa, IEICE Trans. Inf. Syst. E95-D(2):426ââ?¬â??436, 2012). This enables compact implementation and generates\nhigh-entropy random numbers.\nIn this paper, we fabricate and evaluate 39 TRNGs using SR latches on 0.18 Ã?¼m ASICs. Random numbers are generated\nby XORing the outputs of 256 SR latches. Our TRNGs pass the SP800-90B health tests and the AIS20/31 statistical tests\nin changing temperatures (from âË?â??20 to 60 Ã?°C) and voltages (1.80 Ã?± 0.15 V). We also perform an independent and\nidentically distributed (IID) test and calculate min-entropy according to the SP800-90B. With these tests, we are able to\nconfirm that our TRNGs are highly robust against environmental stress. The power consumption and circuit scale of\nour TRNGs are 0.27 mW and 1240.5 gates, respectively. Our TRNGs that use SR latches are small enough to be\nimplemented in embedded devices.
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